PROCUREMENT STANDARD FOR KNOWN GOOD DIE (KGD):
Status: ReaffirmedJanuary 2009JESD49APublished: Sep 2005This standard was created to facilitate the procurement and use of high reliability semiconductor microcircuits or discrete devices provided in...
View ArticleHYBRIDS/MCM
Status: ReaffirmedJanuary 2009JESD93Published: Sep 2005This specification establishes the general requirements for hybrid microcircuits, RF/microwave hybrid microcircuits and MCMs (hereafter referred...
View ArticleJEDEC to Set Fiber Optic System Test & Qualification Standards for Harsh...
In May, 2009 the first meeting of the new JC-13.6 Subcommittee for Fiber Optics Systems in Military and Space Applications drew 37 attendees representing government agencies, aerospace companies and...
View ArticleASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)
Status: ReaffirmedSeptember 2008JESD16-APublished: Apr 1995This standard was revised to clarify assumptions necessary to estimate AOQ, revise the minimum sample size algorithm, address small sample...
View ArticleREQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
JESD625BPublished: Dec 2011This standard establishes the minimum requirements for Electrostatic Discharge (ESD) control methods and materials used to protect electronic devices that are susceptible to...
View ArticleTEST PROCEDURES FOR CUSTOM MONOLITHIC MICROCIRCUITS - SUPERSEDED BY...
Status: RescindedJun-96JEP111Published: Jan 1986Committee(s):JC-13.2JC-13
View ArticleJEDEC and SAE International Join Forces to Set Fiber Optic System Test &...
Groups Call for Industry Participation in New JEDEC Subcommittee Dedicated to Effort ARLINGTON, VA., USA – DECEMBER 16, 2009– JEDEC Solid State Technology Association, the global leader in standards...
View ArticleSTANDARD TEST METHOD UTILIZING X-RAY FLUORESCENCE (XRF) FOR ANALYZING...
JESD213Published: Mar 2010This document is intended to be used by Original Component Manufacturers who deliver electronic components and Original Equipment Manufacturers who are the platform system...
View ArticleALPHA RADIATION MEASUREMENT IN ELECTRONIC MATERIALS
JESD221Published: May 2011 This standard applies generally to gas proportional instruments and the use thereof in measuring materials with an alpha emissivity of less than 10 a·khr-1·cm-2. The primary...
View ArticleJEDEC Announces Publication of Inspection Criteria for Microelectronic...
ARLINGTON, Va., USA – JUNE 21, 2011–JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry, today announced the publication of a...
View ArticleTEST STANDARD FOR THE MEASUREMENT OF PROTON RADIATION SINGLE EVENT EFFECTS IN...
JESD234Published: Oct 2013This test standard defines the requirements and procedures for 40 to 500 MeV proton irradiation of electronic devices for Single Event Effects (SEE), and reporting the...
View ArticleJEDEC Publishes New Test Standard to Measure Effects of Proton Radiation on...
ARLINGTON, Va., USA – OCTOBER 16, 2013– JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry, today announced the publication of...
View ArticleNew JEDEC Subcommittee to Evaluate Technologies for Harsh Environments
ARLINGTON, Va., USA – September 9, 2014 – JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, today announced that its JC-13...
View ArticleCOUNTERFEIT ELECTRONIC PARTS: NON-PROLIFERATION FOR MANUFACTURERS
JESD243Published: Mar 2016This standard identifies the best commercial practices for mitigating and/or avoiding counterfeit products by all manufacturers of electronic parts including, but not limited...
View ArticleNew JEDEC Standard Sets Best Practices for Mitigating Counterfeit Electronic...
ARLINGTON, Va., USA – MARCH 24, 2016 – JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, today announced the publication of...
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